Optical Profile of Modified Silicon for 2D Heterostructures
Sumit Kumar
, Sandeep Kumar Garg
Layered 2D Heterostructures, Optically Active Layered 2D Materials, Sensors.
Optical analysis of irradiated silicon surface have been investigated for the growth of multi chalcogen precursor based chemical vapor deposition synthesis of 2D heterostructures. The Si-surface by 10 keV Ar+ ion bombardment at an oblique angle incidence of 45° for various ion fluences of order ~1x1017 Ar+ cm-2 at room temperature has been done to compare the surface of silicon substrate to grow metal oxide, sulphide 2D heterostructures. Sulphide being the first layer and so on. The investigation have been done to develop the nano layer coatings of 2D hetero materials with different electron densities like 2D-TiO2-ZnO, 2D-MnS-SnO2. There optical properties have also been observer as a key parameter to study the optical porocity for electronic sensors with wide tunable performance.
"Optical Profile of Modified Silicon for 2D Heterostructures", IJSDR - International Journal of Scientific Development and Research (www.IJSDR.org), ISSN:2455-2631, Vol.11, Issue 1, page no.b482-b485, January-2026, Available :https://ijsdr.org/papers/IJSDR2601160.pdf
Volume 11
Issue 1,
January-2026
Pages : b482-b485
Paper Reg. ID: IJSDR_307088
Published Paper Id: IJSDR2601160
Downloads: 000206
Research Area: Physics All
Country: Patna, Bihar, India
ISSN: 2455-2631 | IMPACT FACTOR: 9.15 Calculated By Google Scholar | ESTD YEAR: 2016
An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 9.15 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator
Publisher: IJSDR(IJ Publication) Janvi Wave
