Paper Title

Study of Impact of Annealing Temperature on Electrical Properties of Screen Printed NiO Thick Films

Authors

Sunil Jagannath Patil

Keywords

Thick films, half bride method, electrical parameters, thickness, activation energy

Abstract

The current research work is focused on the study the impact of annealing temperature on electrical properties of NiO thick films prepared by screen printing method. The films were prepared on glass substrate using commercially available NiO nanopowder. The prepared thick films of NiO were annealed at 100, 200, 300, 400, and 500 °C for 3 hours using muffle furnace. The electrical properties of NiO thick films was investigated on the basis of film’s resistivity, activation energy and temperature coefficient of resistance. The electrical parameters were studied using static electrical system and half bride method circuit. The thickness of film was measured using mass difference method and thickness of films was found in micrometer range. The resistivity, thickness and other electrical parameters were found to be different in each sample. It has been investigated that, as an annealing temperature of the films increased the resistivity, TCR and thickness of NiO thick films were increased.

How To Cite

"Study of Impact of Annealing Temperature on Electrical Properties of Screen Printed NiO Thick Films ", IJSDR - International Journal of Scientific Development and Research (www.IJSDR.org), ISSN:2455-2631, Vol.8, Issue 8, page no.302 - 309, August-2023, Available :https://ijsdr.org/papers/IJSDR2308041.pdf

Issue

Volume 8 Issue 8, August-2023

Pages : 302 - 309

Other Publication Details

Paper Reg. ID: IJSDR_208160

Published Paper Id: IJSDR2308041

Downloads: 000347150

Research Area: Physics

Country: -, -, India

Published Paper PDF: https://ijsdr.org/papers/IJSDR2308041

Published Paper URL: https://ijsdr.org/viewpaperforall?paper=IJSDR2308041

About Publisher

ISSN: 2455-2631 | IMPACT FACTOR: 9.15 Calculated By Google Scholar | ESTD YEAR: 2016

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 9.15 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Publisher: IJSDR(IJ Publication) Janvi Wave

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