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ISSN Approved Journal No: 2455-2631 | Impact factor: 8.15 | ESTD Year: 2016
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Paper Title:	Design and Implementation of Digital Circuits in LFSR using Test Pattern Generation
Authors Name:	VUTTARAVILLI AMBEDKAR , PRADEEP KONDAPALLI
Unique Id:	IJSDR2103065
Published In:	Volume 6 Issue 3, March-2021
Abstract:	The external testing of VLSI circuits is old, complex and time consuming. The external testing VLSI circuits is also costly. The Built-in Self-Test is a new technology, applied to the VLSI circuits to test condition of the circuits. The BIST structure consist of four major components such as test patter generator, circuit under test, output response analyser and BIST controller. The Linear Feedback Shift Register (LFSR) is the major component of test pattern generator. LFSR is acting as test pattern generator in most of the BIST structure. The output of the test pattern generation is applied as input to circuit under test. The output of the circuit under test is applied to the output response analyser. The outputs for the corresponding test vector is already stored in the output response analyser. The stored output and the output of the circuit under test are same then the circuit is claimed as fault free, otherwise the circuit has some fault. Three LFSR based test pattern algorithms are developed for the three circuit under test in the proposed research work. The three circuits we considered for the circuit under test are the benchmark circuit’s c432, s27 and c17.
Keywords:	LFSR, BIST, c432, s27, c17
Cite Article:	"Design and Implementation of Digital Circuits in LFSR using Test Pattern Generation", International Journal of Science & Engineering Development Research (www.ijsdr.org), ISSN:2455-2631, Vol.6, Issue 3, page no.387 - 393, March-2021, Available :http://www.ijsdr.org/papers/IJSDR2103065.pdf
Downloads:	000337072
Publication Details:	Published Paper ID: IJSDR2103065 Registration ID:193034 Published In: Volume 6 Issue 3, March-2021 DOI (Digital Object Identifier): Page No: 387 - 393 Publisher: IJSDR \| www.ijsdr.org ISSN Number: 2455-2631

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